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COM240: ADVANCED ELECTRON MICROPROBE TRAINING
Microanalyses using an electron microprobe can be very difficult. Learning how to operate an electron microprobe is only part of the battle. Learning how to get good results is much more difficult. This course explores the many variables that impact the quality of microprobe analyses. These include instrument conditions, software options, standards used, sample preparation, and the specifics of the many different types of materials commonly analyzed.
This is a hands-on course for electron microprobe analysts intended to help unravel the complexities of microanalyses, to help develop strategies for dealing with difficult samples, and to troubleshoot results when they are less than ideal. The Course Outline serves as a guideline for the course. The specific content is adjusted to fit the needs of the participants. A variety of unknowns are investigated and the impact of the various conditions under which they can be analyzed are explored. The objectives are to develop a better understanding of the pitfalls in electron microprobe analyses and to develop strategies to avoid them.
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No sessions currently scheduled for this course.
Are you interested in this course, but it is either not offered or not at a time that works with your schedule? Let us know and we will notify you when it is available next.
Offline registration is available by calling the registrar at 630-887-7100 or by downloading the offline registration form, completing it, and faxing to 630-887-7412.
* If a scheduled course is full, you may be placed in a waiting list.
- Qualitative Analysis I - Stainless steel: Peak ID and semi-quantitative analyses under different conditions
- Qualitative Analysis II - High-Na glass: Element migration
- Experimenting with instrument parameters to minimize Na migration
- Electron gun alignment and saturation
- Quantitative Analysis I - Stainless steel: Comparison of different standardizations
- Adjusting detector slits: Optimize slit settings for specific analyses
- Adjusting SCA settings: Optimize SCA settings for specific analyses
- State Analysis: Determining the oxidation state of iron using peak shifts and peak shape changes
- X-ray Mapping
- Serial Analysis
- Image Processing
- Phase Analysis
- Auto Particle Analysis
- Hardware Calibration
- Quantitative Analysis II: Trace Elements.
- Dead time Correction
- Quantitative Analysis III: Calibration curve analysis
- Quantitative Analysis IV: Peak overlaps
- Quantitative Analysis V: Light elements, Area Integration Mode
- Electron Imaging
This course will not give you cookbook recipes for doing analyses. It will give you the tools to determine for yourself the best strategies for analyzing difficult materials and to determine why a problem is occurring when results are less than ideal. This is a practical course dealing with the complexities of electron microprobe analyses using a JEOL JXA-8900. This course is for those with a basic understanding of electron microprobe analyses who would like to improve the quality of their analyses, would like to better understand how to work with hard to analyze materials, and would like to learn to troubleshoot when the results are less than ideal.
- Electron microscopists
- Materials scientists
- Technicians
- Instrument operators
- Advanced Electron Microprobe Training manual
- JEOL JXA-8900 combined EDS/WDS Electron Probe Microanalyzer
Prior use of JEOL JXA-8900 or JXA-8200 electron microprobe
The student is notified at the end of the course whether or not they have successfully completed the requirements of the course based on:
- 100% attendance
- class participation
- completion of all course material
- completed and signed student evaluation form
Upon successfully meeting these requirements, a student is awarded a certificate of completion and IACET CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or IACET CEU credits.
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