Hooke College



INS-520: TRANSMISSION ELECTRON MICROSCOPY (TEM)

This course provides practical, hands-on learning for new and experienced operators, utilizing lectures, demonstrations, and direct student participation. Two experienced TEM analysts are instructors, tailoring discussions to suit individual skill levels and interests.

The course provides a foundation for new Transmission Electron Microscopy (TEM) operators, and teaches students the skills necessary to align a TEM, and select parameters for acquisition of images, energy dispersive X-ray spectra, and electron diffraction patterns. Students with prior experience learn how to better utilize the multiple analytical capabilities of the TEM for real-world materials characterization.

Those interested in learning basic microscope operations and use of digital cameras for biological imaging will also benefit from this course.

Date Times & Locations Instructor(s) Credits Pricing
4/7/2015 -
4/9/2015
 
Westmont, IL
Tues: 8:00 AM-5:00 PM
Wed: 8:00 AM-5:00 PM
Thurs: 8:00 AM-5:00 PM
 
Schumacher
 
2
 
 
$2,095.00
Register Now
10/6/2015 -
10/8/2015
 
Westmont, IL
Tues: 8:00 AM-5:00 PM
Wed: 8:00 AM-5:00 PM
Thurs: 8:00 AM-5:00 PM
 
Schumacher
 
2
 
 
$2,095.00
Register Now

Are you interested in this course, but it is either not offered or not at a time that works with your schedule? Let us know and we will notify you when it is available next.

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Course Outline
  1. Introduction and discussion of transmission electron microscopy course and instrumentation
  2. Discussion of students' interests
  3. Lecture on types of TEM microscopes and their capabilities, and comparison to other microscopy techniques
  4. Lecture on beam-specimen interaction, image formation, and image processing
  5. Demonstration and student exercises on JEM-3010 TEM; alignment and operation, calibration, and imaging techniques
  6. Discussion of sample preparation techniques and equipment
  7. Lecture and demonstration of analytical techniques: EDS, diffraction, EELS
  8. Student exercises and practice on real-world samples
What You Will Learn

COURSE OBJECTIVE:

  • Given TEM instrument setup and operation for capture of electron images, diffraction patterns and XEDS and EELS spectra, the student will align and operate a TEM, and acquire and interpret images, diffraction patterns and spectra, accomplishing all tasks successfully.
  • Given an overview of TEM theory, instrumentation, operation and applications, the student will align and operate an instrument successfully.
  • Given an overview of electron imaging modes, magnification calibration, and image acquisition using Charge Coupled Device (CCD) cameras, the student will capture images of specimens.
  • Given an overview of analytical electron microscopy techniques for acquisition of chemical composition information, the student will set up the TEM for acquisition of X-Ray Energy Dispersive Spectroscopy (XEDS) and Electron Energy Loss Spectroscopy (EELS) spectra.
  • Instructed in electron diffraction, the student will be able to set up the TEM to acquire diffraction patterns, perform camera length calibration, and measure and interpret diffraction patterns.
  • Provided with an overview of techniques for specimen preparation, the student will select the technique appropriate for the material to be analyzed and the information to be obtained.
  • Introduced to advanced TEM techniques such as convergent beam electron diffraction, scanning transmission electron microscopy (STEM), Z- contrast imaging, mapping, linescans and spectrum imaging, aberration corrected microscopy, and ultrafast electron microscopy (UEM), the student will recognize appropriate specimens and applications for these techniques.
Who Should Enroll

This is a practical, hands-on TEM course, designed for the new user, or for experienced operators who desire additional training in practical techniques on a state-of-the-art instrument:

  • Electron microscopists
  • Materials scientists
  • Technicians
  • Instrument operators
Student Learning Resources
  • Detailed course manual
  • JEOL JEM-3010 300 kV LaB6 TEM with digital imaging, EDS, STEM, energy filtered EELS, and Z-contrast imaging capabilities

All instrumentation, materials, and supplies necessary for successful completion of this course will be provided onsite by the Hooke College of Applied Sciences.

What Students are Saying

"I got some good ideas for things to try with my samples. The course met my objective". Sherwin-Williams Co.

"Classroom is very conducive to learning. Instructors were well equipped and highly knowledgeable of their subject matter. I plan to be back with the rest of our Staff at Stanford". Standford Hospital

"Wonderful instructors, easy to understand. I am very happy with what I took from the course and plan on returning". West Virginia University

Suggested Prerequisites
  • Prior use of TEM
  • Initial in-house or vendor training
Satisfactory Completion Requirements

Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. In addition, the students are required to have 100% attendance during the course, participate in class, complete a student evaluation form and pre and post course assessment forms.

The student is notified at the end of the course whether or not they have successfullycompleted the requirements of the course based on:

  • 100 % attendance
  • class participation
  • completion of all course material
  • completed and signed student evaluation form
  • completed pre and post course assessment forms.

Upon successfully meeting these requirements, a student is awarded a certificate of completion andCEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or CEU credits.

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