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INS520: TRANSMISSION ELECTRON MICROSCOPY (FORMERLY COM250)
This course provides practical, hands-on learning for new and experienced operators, utilizing lectures, demonstrations and direct student participation, using a JEOL JEM-3010 300 kV, LaB6 TEM. Two experienced TEM analysts act as instructors, tailoring discussions to suit individual skill levels and interests.
The course provides a foundation for new TEM operators, and gives students the skills necessary to align a TEM, and select parameters for acquisition of images, EDS spectra, and electron diffraction patterns. Students with prior experience learn how to better utilize the multiple analytical capabilities of the TEM for real-world materials characterization.
Those interested in learning basic microscope operations and use of digital cameras for biological imaging will also benefit from this course.
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Date
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Times & Locations
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Instructor(s)
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Credits
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Cost
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10/19/2010 -
10/21/2010
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Westmont, IL
| Tues: | 8:00 AM-5:00 PM
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| Wed: | 8:00 AM-5:00 PM
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| Thurs: | 8:00 AM-5:00 PM
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Schumacher
Nicholls, Ph.D.
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2
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2/22/2011 -
2/24/2011
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Westmont, IL
| Tues: | 8:00 AM-5:00 PM
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| Wed: | 8:00 AM-5:00 PM
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| Thurs: | 8:00 AM-5:00 PM
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Schumacher
Nicholls, Ph.D.
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2
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10/18/2011 -
10/20/2011
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Westmont, IL
| Tues: | 8:00 AM-5:00 PM
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| Wed: | 8:00 AM-5:00 PM
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| Thurs: | 8:00 AM-5:00 PM
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Schumacher
Nicholls, Ph.D.
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2
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Are you interested in this course, but it is either not offered or not at a time that works with your schedule? Let us know and we will notify you when it is available next.
Offline registration is available by calling the registrar at 630-887-7100 or by downloading the offline registration form, completing it, and faxing to 630-887-7412.
* If a scheduled course is full, you may be placed in a waiting list.
- Introduction and discussion of transmission electron microscopy course and instrumentation
- Discussion of students' interests
- Lecture on types of TEM microscopes and capabilities, and comparison to other microscopy techniques
- Lecture on beam-specimen interaction, image formation and image processing
- Demonstration and student exercises on JEM-3010 TEM; alignment and operation, imaging techniques, calibration
- Discussion of sample preparation techniques and equipment
- Lecture and demonstration of analytical techniques: EDS, diffraction, EELS
- Student exercises and practice on real-world samples
- Proper techniques for working with high vacuum equipment (how to keep your TEM clean and operational)
- Hands-on practice in TEM alignment
- Adjustment of operating parameters to obtain the best results
- Basics of CCD camera operation and digital image acquisition
- Acquisition of EDS and electron diffraction data
- Introduction to scanning transmission electron microscopy (STEM)
- Introduction to electron energy loss spectroscopy (EELS)
- Maintenance and calibration recommendations
This is a practical, hands-on TEM course, designed for the new user, or for experienced operators who desire additional training in practical techniques on a state-of-the-art instrument:
- Electron microscopists
- Materials scientists
- Technicians
- Instrument operators
- Detailed course manual
- JEOL JEM-3010 300 kV LaB6 TEM with digital imaging, EDS, STEM, energy filtered EELS, and Z-contrast imaging capabilities
"I got some good ideas for things to try with my samples. The course met my objective". Sherwin-Williams Co.
"Classroom is very conducive to learning. Instructors were well equipped and highly knowledgeable of their subject matter. I plan to be back with the rest of our Staff at Stanford". Standford Hospital
"Wonderful instructors, easy to understand. I am very happy with what I took from the course and plan on returning". West Virginia University
- Prior use of TEM
- Initial in-house or vendor training
Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. In addition, the students are required to have 100% attendance during the course, participate in class, complete a student evaluation form and pre and post course assessment forms.
The student is notified at the end of the course whether or not they have successfully completed the requirements of the course based on:
- 100 % attendance
- class participation
- completion of all course material
- completed and signed student evaluation form
- completed pre and post course assessment forms.
Upon successfully meeting these requirements, a student is awarded a certificate of completion and IACET CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or IACET CEU credits.
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