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INS510: SCANNING ELECTRON MICROSCOPY (FORMERLY COM200)
The Scanning Electron Microscopy (SEM) course emphasizes hands-on learning. Using five SEM and EMA instruments, students have the opportunity to study their own samples, or test samples provided by our staff, under the direction of McCrone scientists with over 40 years of combined SEM/EDS/WDS experience.
During the course, students learn through lecture, demonstration, and hands-on participation how to setup and operate SEM and EDS instruments, including low-vacuum and field-emission models. The final quarter of the course is devoted to student projects, where students are invited to analyze their own samples on a variety of SEM instruments: JEOL JSM-6460LV low vacuum SEM, JEOL JSM-6480LV low vacuum SEM, JEOL JSM-7500F field emission SEM, JEOL JXA-8900 combined EDS/WDS electron microprobe analyzer, and JEOL JXA-8200 combined EDS/WDS electron microprobe analyzer.
This course provides a foundation for students new to SEM and EDS. At the end of the course, students with no prior experience are able to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, we emphasize procedures to better utilize SEM and EDS to solve practical problems. The experience of our instructors allows them to offer insight on optimizing SEM and EDS analysis for a wide range of materials analysis questions.
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Are you interested in this course, but it is either not offered or not at a time that works with your schedule? Let us know and we will notify you when it is available next.
Offline registration is available by calling the registrar at 630-887-7100 or by downloading the offline registration form, completing it, and faxing to 630-887-7412.
* If a scheduled course is full, you may be placed in a waiting list.
- Introduction and discussion of Scanning Electron Microscopy course and instrumentation.
- Discussion of student’s interest.
- Lecture on comparison of types of SEM microscopes and other microscopes.
- Lecture and practice on beam-specimen interaction, image formation and image processing.
- Demonstration on Scanning Electron Microscopes.
- Demonstration and student participation on sample preparation, techniques and equipment.
- Scanning Electron Microscopy lab exercises in imaging instrument setup and operation.
- Lecture and demonstrations on X-Ray analysis theory and detection, qualitative and quantitative EDS and linescans and mapping.
- Practice and participation of students on real-world samples.
- COURSE OBJECTIVE: Given SEM instrumentation setup and operation, as well as techniques in SEM sample preparation, capturing secondary and backscatter micrographs, and EDS qualitative and quantitative analysis, the student will setup and operate a SEM, prep materials for imaging and analysis, conduct analysis and interpret it, accomplishing all tasks successfully.
- Given SEM (including low-vacuum and field-emission models), and EDS instruments, the student will setup (align) and operate the instruments successfully.
- Given SEM sample preparation techniques and equipment, the student will mount samples appropriately for imaging and analysis.
- Given SEM instrumentation the student will acquire techniques in obtaining secondary electron and backscatter electron micrographs.
- Given SEM and EDS instrumentation the student will perform EDS qualitative and quantitative analysis.
This practical SEM course provides a core foundation for students new to SEM and EDS or for those who would like to improve practical use and techniques
- Electron microscopists
- Materials scientists
- Technicians
- Instrument operators
- Detailed course manual
- JEOL JSM-6460LV low vacuum SEM
- JEOL JSM-6480LV low vacuum SEM
- JEOL JSM-7500F field emission SEM,
- JEOL JXA-8900 combined EDS/WDS electron microprobe analyzer
- JEOL JXA-8200 combined EDS/WDS electron microprobe analyzer.
“It was great to have three instructors for eight students... The small class size was great!” Centre of Forensic Sciences
“Instructors know the student’s level of expertise and were willing to stay past normal lecture hours. The review of certain materials was very helpful and the classroom environment was very relaxed.” New York City EPA
“The hands-on work was great. I liked having three instructors, each with unique experience.” Maryland State Police
- Prior use of SEM with EDS
- Initial in-house or vendor training
Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. In addition, the students are required to have 100% attendance during the course, participate in class, complete a student evaluation form and pre and post course assessment forms.
The student is notified at the end of the course whether or not they have successfully completed the requirements of the course based on:
- 100 % attendance
- class participation
- completion of all course material
- completed and signed student evaluation form
- completed pre and post course assessment forms.
Upon successfully meeting these requirements, a student is awarded a certificate of completion and IACET CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or IACET CEU credits.
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