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COM210: ADVANCED SCANNING ELECTRON MICROSCOPE BASED TOOLS FOR MICROANALYSIS
The scanning electron microscope (SEM) is a fantastic tool for clearly visualizing small-scale materials of interest utilizing electron imaging. Better yet, it is also possible to acquire very detailed information about chemistry, crystal structure, texture, fabric, and developmental history. Due to the variety of interactions that take place between the electron beam and the sample, as well as the flexibility of SEM sample chamber configurations, numerous tools can be added to an SEM to capture this information.
This course concentrates on X-ray spectrometry, both energy dispersive and wavelength dispersive, especially as they pertain to chemical or spectral mapping. It also covers electron backscattered diffraction analysis, Monte Carlo modeling, and touches on cathodoluminescence, and sample preparation and transfer.
Those familiar with SEM imaging, but wanting to expand their expertise with these analytical methods benefit from this course. Students considering adding these techniques to their laboratory also gain valuable background knowledge. Students learn through lectures, demonstrations by instructors and their own, hands-on instrument operation. Students are encouraged to bring samples with them to the course so they can learn using their own real world samples.
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Date
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Times & Locations
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Instructor(s)
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Credits
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Cost
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10/11/2010 -
10/15/2010
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Westmont, IL
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Schwandt, Ph.D.
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3.5
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Are you interested in this course, but it is either not offered or not at a time that works with your schedule? Let us know and we will notify you when it is available next.
Offline registration is available by calling the registrar at 630-887-7100 or by downloading the offline registration form, completing it, and faxing to 630-887-7412.
* If a scheduled course is full, you may be placed in a waiting list.
- Brief refresher of the physics of scanning electron microscopy and the types of signals generated during electron beam interaction with samples.
- Lecture on the detection and analysis of X-rays by energy dispersive (EDS) and wavelength dispersive spectrometry (WDS).
- Demonstration and student experimentation with chemical microanalysis.
- Lecture on methods mapping chemistry.
- Student experimentation on real samples using the instruments.
- Lecture on electron backscattered diffraction and combined structure and chemistry mapping.
- Demonstration by instructors with student participation.
- Lecture on additional methods and tools for the SEM.
- Student investigation of samples.
- Qualitative and Quantitative X-ray microanalysis by EDS and WDS
- X-ray mapping techniques
- Electron backscattered diffraction (EBSD) analysis and combined chemical and structural mapping
- Sampling and sample preparation methods
This practical SEM course provides a core foundation for electron microscopists who would like to improve their practical microanalysis techniques. Familiarity with basic scanning electron microscopy and x-ray microanalysis, through a course such as COM 200, is strongly recommended.
- Electron microscopists
- Materials scientists
- Technicians
- Instrument operators
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- Detailed course manual
- JEOL JSM-6490LV low vacuum SEM
- EDAX Pegasus Integrated EDS and EBSD
- Prior use of SEM with EDS
- Initial in-house or vendor training
- COM 200
The student is notified at the end of the course whether or not they have successfully completed the requirements of the course based on:
- 100% attendance
- class participation
- completion of all course material
- completed and signed student evaluation form
Upon successfully meeting these requirements, a student is awarded a certificate of completion and IACET CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or IACET CEU credits.
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